Model 20/20 PSD
The Reflection Imaging Model 20/20 Position Sensitive X-ray Detector is designed for simultaneous diffraction data collection over its effective length of two inches with a spatial resolution of less than 60 microns. Performance characteristics make it an extremely useful detector for applications including: Small Angle Scattering, Reflectometry, Residual Stress, Phase Transformation Studies, and General Powder Diffraction. Our PSD is available with various accessories and in several interface configurations to suit your application or compliment your existing diffraction equipment.
Key Features:
§ In addition to excellent spatial resolution, it is truly a proportional counter, with energy resolution for Copper K-alpha of better than 23%.
§ Xenon working gas for a high intrinsic quantum efficiency of 78% for Copper K-alpha, and low fluorescence background.
§ Sealed detector head exhibits excellent short and long term stability; it is not affected by gas density variations due to temperature and pressure.
§ Fully integrated and proven system design is reliable and durable. Time before repair typically exceeds the life of an X-ray tube.
For further information, contact us at:
Reflection Imaging, Inc.
2701 University Avenue, #327
P.O. Box 55252
Madison, WI 53705
PH: 608.238.5068
FAX: 608.238.5080
©2002 Reflection Imaging, Inc.