Model 20/20 PSD Applications

The PSD provides accurate and efficient X-ray position sensing over a large solid angle, significantly reducing data collection time. Applications where fast data collection would be an asset include routine material identification and general powder diffraction, studies of short lived biological materials, small angle scattering and reflectivity measurements, residual stress measurements, and the observation of rapidly changing lattice parameters during phase transitions or cyclical stress.   Reflection Imaging can provide accessories to adapt existing diffractometers for use with the Model 20/20 PSD.