Model 20/20 PSD Diffraction Data

This diffraction pattern of 20 micron quartz was obtained with the Model 20/20 PSD on a refurbished Philips^TM Theta/Two-Theta powder diffractometer with a WCDU X-ray source. A nickel filter removed most of the K-beta radiation from the incident beam. Beam divergence was one degree, and two degree Soller slits were placed in both the incident and diffracted beam paths. X-ray source was operated at low power (i.e., 30kV and 10 mA). Scan rate was 4 degrees per minute, and detector was 22cm from sample. Angular resolution was limited by sample thickness (approx. 2mm) to about 0.17 degrees.